Job Description
Job Title: Equipment: Metrology/Failure Analysis Technician
Location: Santa Clara, CA (SC2 Campus)
100% onsite
Must have: We need a candidate with previous dual FIB beam sample preparation and imagining exp.
Not looking for candidates that have 20+ years exp.
Schedule: Initial schedule will be Sunday to every other Wednesday 6 am to 6 pm. After training is completed, schedule flexibility will be required to help cover vacations gaps during weekend and night shift.
Job Description:
Metrology/Failure Analysis Engineering Technician performs functions associated with photomask production including equipment, operations, and failure analysis sample preparation/imaging. The technician is responsible for equipment preventive maintenance, troubleshooting, spares and sustaining. In addition, the technician is responsible for preparing and imaging dual beam FIB samples and collecting Atomic Force Microscope (AFM) data to support our product reliability and failure analysis efforts. The technician may be responsible for the buddy, trainer, and certifier levels and in charge of updating training manuals. The technician may participate in safety forums and Emergency Response Team as required. Work is somewhat complex and is performed within the spectrum ranging from narrowly defined parameters and limited judgement up to highlight complex and nonstandard assignments in nature and broadly defined parameters. High degree of judgment and initiative is required in resolving complex nonstandard problems and developing recommendations. The technician normally receives general instructions on routine work, and detailed instructions on new work.
Responsibilities:
Operate and maintain equipment, ensuring proper calibration and performance.
Work closely with cross-functional teams to support product reliability and failure analysis efforts
Prepare and image dual beam FIB samples using established procedures and guidelines
Collect and analyze AFM data, providing accurate and reliable results
Maintain a safe and clean work environment, following all safety protocols and procedures
Requirements:
Bachelor’s degree in a related field (e.g. material science, physics, chemistry, electrical engineering, mechanical engineering) or equivalent experience
Experience with dual beam FIB sample preparation, Scanning Electron Microscope (SEM) and AFM data collection
Strong understanding of material science and failure analysis techniques
Experience with preventive maintenance and equipment troubleshooting
Excellent attention to detail and problem-solving skills
Ability to work independently and as part of a team.